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Enter 2–3 ISSNs and compare APC, review time, article volume, and open-access status side by side.
| Basic information | IEEE Design & Test of Computers |
|---|---|
| Title | IEEE Design & Test of Computers |
| ISSN | 0740-7475, 1558-1918 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Country/Region | United States |
| Subject | Computer Science |
| Open access | — |
| APC | — |
| Review | — |
| Articles/yr | 2,981 |
| h-index | 112 |
| 2-yr mean citedness | 0.00 |
| DOAJ | — |
| Submission page | — |